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Mutoh Industries Ltd.

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USPTO Granted Patents = 72

% Expired Patents = 6.9

EPO Patents = 5

Trademarks = 5

Forward Citations = 555

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72 inventors (with patents filed for the assignee):

Tetsuya Iwanaga (10 out of 10 patents)

Hiroyuki Furuichi (4 out of 8 patents)

Isamu Takahashi (4 out of 13 patents)

4. Hajime Tatsuzawa (4 out of 5 patents)

5. Tatsuyoshi Ikuta (4 out of 4 patents)

6. Hideo Noda (3 out of 5 patents)

7. Hiroyasu Sasada (3 out of 3 patents)

8. Toshiaki Miyasaka (3 out of 4 patents)

9. Toshiaki Matsushima (3 out of 3 patents)

10. Ryuji Arai (3 out of 3 patents)

11. Yoichi Abe (2 out of 7 patents)

12. Tomoo Nakajima (2 out of 2 patents)

13. Chris Brown (2 out of 2 patents)

14. Katsumi Nashimoto (2 out of 2 patents)

15. Christopher M Brown (2 out of 2 patents)

Core Competencies:

Inkjet Printer

Three-Dimensional Modeling

Spectrophotometer

Gradation-Pattern Creation

Automatic Drafting Machine

Plotter

Thermal Recording

Image Processing

LED Illumination Control

Automatic Lead Supply

Binary Circuit

Coordinate Reader

72 patents: Sort by Forward Citations

1. 12386567 - Raster image conversion device and program, and printing system (2025-08-12),

2. 11897253 - Illumination control method of LED lamp for ink-jet printer (2024-02-13),

3. 11097530 - Three-dimensional modeling device and three-dimensional modeling method (2021-08-24),

4. 10421292 - Cylinder printing jig and printer using cylinder printing jig (2019-09-24),

5. 9921365 - Light-guide-plate creation method and device (2018-03-20),

6. 9111199 - Gradation-pattern creation program (2015-08-18),

7. 8476574 - Method of deconvolution of spectral data (2013-07-02),

8. 8284444 - Apparatus and method that reduces streaking by using a deformed data portion to not array dots continuously in the main scan direction of the print head in the end portions of the sub-scan direction (2012-10-09),

9. 8279441 - Spectrophotometer and method (2012-10-02),

10. 8233188 - Apparatus and method that reduces streaking by using a deformed data portion to not array dots continuously in the main scan direction of the print head in the end portions of the sub-scan direction (2012-07-31),

11. 8177316 - Ink jet printing device (2012-05-15),

12. 6724499 - Pseudo halftone image expression method (2004-04-20),

13. 6595612 - Inkjet printer capable of minimizing chromatic variation in adjacent print swaths when printing color images in bidirectional model (2003-07-22),

14. 6386689 - Ink jet printers (2002-05-14),

15. 6273550 - Inkjet printer capable of minimizing chromatic variation in adjacent print swaths when printing color images in bidirectional mode (2001-08-14),

Company Overview

Mutoh Industries Ltd., headquartered in Tokyo, Japan, specializes in the development and manufacturing of advanced inkjet printing technology. The company is renowned for its innovative solutions in various applications, including large-format printers and specialized printing systems. Mutoh's expertise extends to three-dimensional modeling, spectrophotometry, and image processing, enabling high-quality output and precision in printing. With a commitment to technological advancement, Mutoh continues to lead in the fields of automatic drafting machines and thermal recording solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

72 Patents

#665 in Tokyo

#1,393 in Japan

#10,400 in the World

Mutoh Industries Ltd.

Forward Citations = 555

72 inventors:

Tetsuya Iwanaga (10 out of 10 patents)

Hiroyuki Furuichi (4 out of 8 patents)

Isamu Takahashi (4 out of 13 patents)

4. Hajime Tatsuzawa (4 out of 5 patents)

5. Tatsuyoshi Ikuta (4 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mutoh Industries Ltd.. Retrieved from https://idiyas.com/company/mutoh-industries

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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