Wilmington, DE, United States of America

Mk Systems USA Inc.

Calculating rank
USPTO Granted Patents = 13


Trademarks = 4

Forward Citations = 6

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22 inventors (with patents filed for the assignee):

goldMedal Jean Kypreos (3 out of 8 patents)

silverMedal Oliver Unter Ecker (2 out of 11 patents)

bronzeMedal Nickolas Westman (2 out of 2 patents)

4.  Michael Ropert (2 out of 2 patents)

5.  David Clewer (2 out of 2 patents)

6.  Richard Fliam (2 out of 2 patents)

7.  Edwin Salomons (1 out of 7 patents)

8.  Alan Bishop (1 out of 8 patents)

9.  Rabih Filfili (1 out of 2 patents)

10.  Alex Macaulay (1 out of 2 patents)

11.  Mikael Le Guerroue (1 out of 1 patent)

12.  Freddy Ceranton (1 out of 1 patent)

13.  Brian O'Neil (1 out of 1 patent)

14.  Mark W Robertson (1 out of 1 patent)

15.  Timothy Lett (1 out of 1 patent)


13 patents:

Company Overview
Mk Systems USA Inc., based in Wilmington, Delaware, specializes in advanced technology solutions tailored for various industries. The company focuses on developing innovative systems and software that enhance operational efficiency and productivity. With a commitment to research and development, Mk Systems engages in cutting-edge projects that span multiple domains, including automation and data management. Their expertise positions them as a key player in delivering high-quality technological advancements that meet the evolving needs of their clients.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

13 Patents

#281 in Wilmington, DE

#363 in Delaware

#23,863 in US

#45,104 in the World

Wilmington, DE (US)
Wilmington, DE, United States of America
Forward Citations = 6

22 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mk Systems USA Inc.. Retrieved from https://idiyas.com/company/mk-systems-usa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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