Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
10 Patents
#1,916 in Tokyo
#4,406 in Japan
#56,119 in the World
Mitaka Instrument Company Limited
Forward Citations = 251
15 inventors:
Mitaka Instrument Company Limited
Calculating rank
Forward Citations = 251
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15 inventors (with patents filed for the assignee):
Shigeo Yasuda (9 out of 10 patents)
Akira Matsuda (9 out of 13 patents)
Hiroshi Nishino (7 out of 7 patents)
4. Motoaki Iwasaki (7 out of 8 patents)
5. Norio Goshima (5 out of 8 patents)
6. Takashi Takusagawa (1 out of 10 patents)
7. Akira Fujikawa (1 out of 3 patents)
8. Masaaki Kaida (1 out of 1 patent)
9. Junichi Murata (1 out of 1 patent)
10. Makoto Tanaka (1 out of 2 patents)
11. Masato Maeda (1 out of 1 patent)
12. Morimichi Iguchi (1 out of 1 patent)
13. Seisuke Sano (1 out of 1 patent)
14. Yoshihiro Hayakawa (1 out of 4 patents)
15. Yoshihiro Havakawa (1 out of 1 patent)
10 patents:
Company Overview
Mitaka Instrument Company Limited, based in Tokyo, specializes in the development and manufacturing of precision instruments and optical devices. The company focuses on advanced technologies in the fields of imaging and measurement, catering to various industries including scientific research and healthcare. With a commitment to innovation, Mitaka Instrument plays a significant role in enhancing the capabilities of optical systems, contributing to advancements in both domestic and international markets.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mitaka Instrument Company Limited. Retrieved from https://idiyas.com/company/mitaka-instrument-company
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]