Company Badge
USPTO Data Jan 1 1976 - Oct 6 2026
10 Patents
#7 in Oshkosh, WI
#668 in Wisconsin
#29,839 in US
#55,986 in the World
Milprint, Inc.
Forward Citations = 165
15 inventors:
Oshkosh, WI, United States of America
Milprint, Inc.
% Expired Patents = 30.0
Forward Citations = 165
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15 inventors (with patents filed for the assignee):
Kenneth C Kappes (3 out of 3 patents)
Kenneth Eastman Kiesow (2 out of 2 patents)
Michael Scott Hartman (2 out of 2 patents)
4. Rusty L Witthuhn (1 out of 2 patents)
5. Scott Anthony Fuller (1 out of 1 patent)
6. Curtis Randolph Barr (1 out of 1 patent)
7. Daniel S Papenfuss (1 out of 1 patent)
8. Amy Lynn Kraimer (1 out of 4 patents)
9. Michael S Keckeisen (1 out of 1 patent)
10. Stephanie L Emenecker (1 out of 1 patent)
11. Mahmood Reza Rassouli (1 out of 1 patent)
12. Sam Edward Wuest (1 out of 6 patents)
13. Glenn R Sontag (1 out of 1 patent)
14. Benjamin M Tranholm (1 out of 1 patent)
15. Bentley W Elliott (1 out of 1 patent)
10 patents:
Company Overview
Milprint, Inc. is a specialized manufacturer based in Oshkosh, Wisconsin, focusing on innovative printing solutions for various industries. The company excels in producing high-quality labels, packaging, and printed materials, catering to sectors such as food and beverage, healthcare, and consumer goods. Milprint leverages advanced printing technologies and materials to deliver customized products that meet the unique needs of its clients, ensuring compliance with industry standards and enhancing brand visibility.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Milprint, Inc.. Retrieved from https://idiyas.com/company/milprint
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]