Company Badge
USPTO Data Jan 1 1976 - Nov 10 2026
16 Patents
#248 in Chicago, IL
#1,015 in Illinois
#19,966 in US
#37,952 in the World
Meyer/glass Design, Ltd.
Forward Citations = 178
20 inventors:
Chicago, IL, United States of America
Meyer/glass Design, Ltd.
Calculating rank
% Expired Patents = 6.3
Forward Citations = 178
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20 inventors (with patents filed for the assignee):
Randall Jon Klimpert (9 out of 14 patents)
Dianne Elizabeth Lauble (6 out of 7 patents)
Craig Dennis Sellers (6 out of 8 patents)
4. Allison Katzman (5 out of 5 patents)
5. Michael John Lichodziejewski (5 out of 5 patents)
6. Paula Yurkovic (5 out of 5 patents)
7. John R Wildman (3 out of 31 patents)
8. Burton C Meyer (3 out of 77 patents)
9. Horst D Herbstler (2 out of 7 patents)
10. Lisa Ellen Gelfond (1 out of 6 patents)
11. Elizabeth Pacza (1 out of 1 patent)
12. Craig C Williamson (1 out of 12 patents)
13. Robert Wildman (1 out of 1 patent)
14. Ann Danielak (1 out of 1 patent)
15. Russell Gold (1 out of 1 patent)
16 patents:
Company Overview
Meyer/glass Design, Ltd. is a Chicago-based company specializing in innovative glass design and manufacturing solutions. The organization focuses on creating high-quality, custom glass products for various applications, including architectural, decorative, and functional uses. With a commitment to craftsmanship and design excellence, Meyer/glass integrates advanced technology and artistic vision to deliver unique glass solutions that enhance both aesthetics and functionality in diverse environments.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Meyer/glass Design, Ltd.. Retrieved from https://idiyas.com/company/meyer-glass-design
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]