Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
4 Patents
#7 in North Wales, PA
#2,214 in Pennsylvania
#60,704 in US
Metal Edge International, Inc.
Forward Citations = 17
11 inventors:
North Wales, PA, United States of America
Metal Edge International, Inc.
Calculating rank
EPO Patents = 1
Forward Citations = 17
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11 inventors (with patents filed for the assignee):
Armin C Frank (3 out of 3 patents)
Stephen Smith (1 out of 16 patents)
Andrew W Levan (1 out of 3 patents)
4. Joshua Q Moyer (1 out of 1 patent)
5. Jeffrey L Schroy (1 out of 1 patent)
6. Jonathan C Tyson (1 out of 1 patent)
7. David J Dravuschak (1 out of 1 patent)
8. Joseph M Dorner, Jr (1 out of 1 patent)
9. Christopher Yatsko (1 out of 1 patent)
10. Leonard C Wagner (1 out of 2 patents)
11. James W Day (1 out of 1 patent)
4 patents:
Company Overview
Metal Edge International, Inc. is a leading manufacturer and supplier of metal edging products for various industries. With a strong focus on innovation and quality, we provide custom solutions to meet the specific needs of our clients. Our products are trusted by architects, contractors, and designers worldwide for their durability and precision. Visit our website to learn more about our wide range of metal edging solutions.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Metal Edge International, Inc.. Retrieved from https://idiyas.com/company/metal-edge-international
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]