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USPTO Data Jan 1 1976 - Oct 27 2026
10 Patents
#1 in Doar Afek
#639 in Israel
#56,119 in the World
Mego Afek Industrial Measuring Instruments
Forward Citations = 706
13 inventors:
Mego Afek Industrial Measuring Instruments
Calculating rank
% Expired Patents = 10.0
Trademarks = 2
Forward Citations = 706
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13 inventors (with patents filed for the assignee):
Asher Ben-Nun (2 out of 4 patents)
Aharon Weiss (2 out of 3 patents)
Asher Ben-Noon (1 out of 3 patents)
4. Zvi Wasserman (1 out of 1 patent)
5. Avraham Heeman (1 out of 1 patent)
6. Johannes H Broeren (1 out of 1 patent)
7. Shimshon Shmuter (1 out of 1 patent)
8. Shimon Muchnik (1 out of 1 patent)
9. Yaakov Kaganovsky (1 out of 1 patent)
10. Vadim Gelfer (1 out of 1 patent)
11. Izhar Shienfeld (1 out of 1 patent)
12. Raanan Volk (1 out of 3 patents)
13. Ami Drach (1 out of 1 patent)
10 patents:
Company Overview
Mego Afek Industrial Measuring Instruments specializes in the development and manufacturing of precision measuring devices tailored for various industrial applications. The company focuses on delivering high-quality instruments that enhance measurement accuracy and efficiency across sectors such as manufacturing, construction, and engineering. Based in Doar Afek, Israel, Mego Afek is committed to innovation and technological advancement, ensuring that its products meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mego Afek Industrial Measuring Instruments. Retrieved from https://idiyas.com/company/mego-afek-industrial-measuring-instruments
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]