Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
10 Patents
#29 in Camarillo, CA
#7,121 in California
#29,892 in US
#56,119 in the World
Medical Analysis Systems, Inc.
Forward Citations = 59
20 inventors:
Camarillo, CA, United States of America
Medical Analysis Systems, Inc.
Calculating rank
% Expired Patents = 20.0
Trademarks = 5
Forward Citations = 59
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20 inventors (with patents filed for the assignee):
Kirti I Davé (2 out of 2 patents)
Janos Botyanszki (2 out of 3 patents)
Nihmat A Morjana (2 out of 2 patents)
4. Ivan E Modrovich (2 out of 24 patents)
5. Shing F Kwan (2 out of 8 patents)
6. Brian Robert Fernández (1 out of 1 patent)
7. Sean Michael Teel (1 out of 1 patent)
8. Alex Michael Seizew (1 out of 1 patent)
9. Brian Robert Fernández (1 out of 1 patent)
10. Kirti I Davé (1 out of 2 patents)
11. Eva Sintar (1 out of 2 patents)
12. Zsolt Lengyel (1 out of 3 patents)
13. Jozsef Hepp (1 out of 5 patents)
14. Angela M Puia (1 out of 1 patent)
15. Rebecca J Hunt (1 out of 4 patents)
10 patents:
Company Overview
Medical Analysis Systems, Inc., based in Camarillo, California, specializes in the development and manufacturing of advanced medical diagnostic systems. The company focuses on innovative technologies that enhance the accuracy and efficiency of medical analysis, contributing to improved patient outcomes. With a commitment to research and development, Medical Analysis Systems, Inc. aims to lead in the medical technology sector, providing solutions that address critical healthcare challenges.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Medical Analysis Systems, Inc.. Retrieved from https://idiyas.com/company/medical-analysis-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]