Wallingford, CT, United States of America

Measurement Systems, Inc.


USPTO Granted Patents = 13

% Expired Patents = 15.4

Trademarks = 1

Forward Citations = 312

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21 inventors (with patents filed for the assignee):

goldMedal Richard M Passaro (3 out of 3 patents)

silverMedal Raymond J Paquette (2 out of 2 patents)

bronzeMedal Robert A Blain (2 out of 2 patents)

4.  Jeffrey D Philips (2 out of 2 patents)

5.  Edward A Schuler (2 out of 2 patents)

6.  Tony Vincent Jacques (1 out of 3 patents)

7.  John W Newman (1 out of 39 patents)

8.  Steven Cai (1 out of 6 patents)

9.  Paul J Leblanc (1 out of 4 patents)

10.  Thomas R Ecsedy (1 out of 1 patent)

11.  Leslie W Yoho (1 out of 1 patent)

12.  James R Shively (1 out of 2 patents)

13.  Charles William Pittman, Jr (1 out of 1 patent)

14.  Harry F Deutsch (1 out of 1 patent)

15.  Timothy D Semones (1 out of 1 patent)


13 patents:

Company Overview
Measurement Systems, Inc. is a specialized provider of advanced measurement and control solutions, primarily serving industries that require precision instrumentation. Based in Wallingford, Connecticut, the company focuses on developing innovative technologies that enhance measurement accuracy and reliability across various applications. Their expertise spans multiple domains, including industrial automation, process control, and environmental monitoring, positioning them as a key player in the field of measurement systems.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

13 Patents

#17 in Wallingford, CT

#522 in Connecticut

#23,815 in US

#44,988 in the World

Wallingford, CT (US)
Wallingford, CT, United States of America
Forward Citations = 312

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Measurement Systems, Inc.. Retrieved from https://idiyas.com/company/measurement-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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