Wallingford, CT, United States of America

Measurement Systems, Inc.

Calculating rank
USPTO Granted Patents = 13

% Expired Patents = 15.4

Trademarks = 1

Forward Citations = 313

Loading Chart...
Loading Chart...

21 inventors (with patents filed for the assignee):

goldMedal Richard M Passaro (3 out of 3 patents)

silverMedal Raymond J Paquette (2 out of 2 patents)

bronzeMedal Robert A Blain (2 out of 2 patents)

4.  Jeffrey D Philips (2 out of 2 patents)

5.  Edward A Schuler (2 out of 2 patents)

6.  Tony Vincent Jacques (1 out of 3 patents)

7.  John W Newman (1 out of 39 patents)

8.  Steven Cai (1 out of 6 patents)

9.  Paul J Leblanc (1 out of 4 patents)

10.  Thomas R Ecsedy (1 out of 1 patent)

11.  Leslie W Yoho (1 out of 1 patent)

12.  James R Shively (1 out of 2 patents)

13.  Charles William Pittman, Jr (1 out of 1 patent)

14.  Harry F Deutsch (1 out of 1 patent)

15.  Timothy D Semones (1 out of 1 patent)


13 patents:

Company Overview
Measurement Systems, Inc. is a specialized provider of advanced measurement and control solutions, primarily serving industries that require precision instrumentation. Based in Wallingford, Connecticut, the company focuses on developing innovative technologies that enhance measurement accuracy and reliability across various applications. Their expertise spans multiple domains, including industrial automation, process control, and environmental monitoring, positioning them as a key player in the field of measurement systems.
Profile summary synthesized from public USPTO records and patent filings.

logo

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

13 Patents

#17 in Wallingford, CT

#523 in Connecticut

#23,863 in US

#45,104 in the World

Wallingford, CT (US)
Wallingford, CT, United States of America
Forward Citations = 313

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Measurement Systems, Inc.. Retrieved from https://idiyas.com/company/measurement-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…