% Expired Patents = 50.0

Forward Citations = 269

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4 inventors (with patents filed for the assignee):

Winston Z Ho (8 out of 16 patents)

Hosheng Tu (3 out of 153 patents)

John Collins (1 out of 1 patent)

4. Dennis Y Chou (1 out of 1 patent)

8 patents: Sort by Forward Citations

1. 8232092 - Apparatus and method for digital magnetic beads analysis (2012-07-31),

2. 8148139 - Light transmitted assay beads (2012-04-03),

3. 7871770 - Light transmitted assay beads (2011-01-18),

4. 7858307 - Light transmitted assay beads (2010-12-28),

5. 7344528 - Optic fiber probe (2008-03-18),

6. 7339153 - Photon counting methods and devices with electrical pulse duration and intensity measurement (2008-03-04),

7. 7297154 - Optical apparatus for detecting and treating vulnerable plaque (2007-11-20),

8. 7153299 - Optical apparatus for detecting and treating vulnerable plaque (2006-12-26),

Company Overview

Maxwell Sensors, Inc. is a leading provider of state-of-the-art sensor technologies for various industries. With a focus on innovation and quality, we offer a wide range of sensor solutions that are designed to meet the unique needs of our clients. Our team of experts is dedicated to delivering cutting-edge technology and exceptional customer service to ensure the success of our partners.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

8 Patents

#27 in Santa Fe Springs, CA

#8,531 in California

#35,893 in US

Santa Fe Springs, CA, United States of America

Maxwell Sensors, Inc.

Forward Citations = 269

4 inventors:

Winston Z Ho (8 out of 16 patents)

Hosheng Tu (3 out of 153 patents)

John Collins (1 out of 1 patent)

4. Dennis Y Chou (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Maxwell Sensors, Inc.. Retrieved from https://idiyas.com/company/maxwell-sensors

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]