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USPTO Data Jan 1 1976 - Oct 27 2026
24 Patents
#12 in Evanston, IL
#722 in Illinois
#13,900 in US
#26,701 in the World
Mark Controls Corporation
Forward Citations = 384
26 inventors:
Evanston, IL, United States of America
Mark Controls Corporation
Calculating rank
Trademarks = 11
Forward Citations = 384
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26 inventors (with patents filed for the assignee):
Zoltan Goncze (2 out of 3 patents)
William J Salesky (2 out of 7 patents)
Harold A Lacquement (2 out of 2 patents)
4. Donald E Carlson (2 out of 2 patents)
5. George W Sekiya (2 out of 2 patents)
6. Wesley L Taylor (2 out of 2 patents)
7. Harold P Adams (2 out of 2 patents)
8. Jon W Lindholm (2 out of 16 patents)
9. Dane F Watkins (1 out of 1 patent)
10. David F Koeneman (1 out of 2 patents)
11. John E Bridges (1 out of 1 patent)
12. Edward E Modes (1 out of 6 patents)
13. Arnold Vincent Dano (1 out of 3 patents)
14. Roland Aaron Gladstone (1 out of 2 patents)
15. Charles H Priesmeyer (1 out of 2 patents)
24 patents:
Company Overview
Mark Controls Corporation is a specialized manufacturer based in Evanston, Illinois, focusing on advanced control systems and instrumentation for various industrial applications. The company is recognized for its expertise in developing innovative solutions that enhance process efficiency and reliability across sectors such as water treatment, oil and gas, and manufacturing. With a commitment to quality and technological advancement, Mark Controls plays a pivotal role in providing critical components that support operational excellence in demanding environments.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mark Controls Corporation. Retrieved from https://idiyas.com/company/mark-controls
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]