Company Badge
USPTO Data Jan 1 1976 - Nov 10 2026
13 Patents
#13 in Arlington Heights, IL
#1,183 in Illinois
#23,898 in US
#45,181 in the World
Marchon, Inc.
Forward Citations = 237
16 inventors:
Arlington Heights, IL, United States of America
Marchon, Inc.
Calculating rank
Trademarks = 11
Forward Citations = 237
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16 inventors (with patents filed for the assignee):
Marvin Smollar (10 out of 24 patents)
Richard B Mazursky (6 out of 8 patents)
Edward Watrobka (2 out of 2 patents)
4. Lo C Kai (1 out of 1 patent)
5. David Waskin (1 out of 1 patent)
6. Bette Kaelin (1 out of 1 patent)
7. William F Walter (1 out of 1 patent)
8. Ed Watrobka (1 out of 1 patent)
9. Dan Polanek (1 out of 1 patent)
10. K Y Yeung (1 out of 1 patent)
11. Edmond Cheung (1 out of 1 patent)
12. Ronald Liedtke (1 out of 1 patent)
13. Kwok Sui Kit (1 out of 2 patents)
14. Scott Allbee (1 out of 1 patent)
15. Tracy Pearson (1 out of 1 patent)
13 patents:
Company Overview
Marchon, Inc. is a prominent player in the eyewear industry, specializing in the design and manufacturing of high-quality optical and sun eyewear. The company is known for its innovative approach, combining advanced materials and cutting-edge technology to create stylish and functional eyewear solutions. With a strong presence in the global market, Marchon collaborates with various brands and designers, ensuring a diverse portfolio that caters to a wide range of consumer preferences and needs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Marchon, Inc.. Retrieved from https://idiyas.com/company/marchon
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]