Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
11 Patents
#1 in Washington Court House, OH
#1,143 in Ohio
#27,514 in US
#51,761 in the World
Mac Tools, Inc.
Forward Citations = 213
17 inventors:
Washington Court House, OH, United States of America
Mac Tools, Inc.
Forward Citations = 213
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17 inventors (with patents filed for the assignee):
Dean E Myers (3 out of 4 patents)
James F Mellott (3 out of 4 patents)
Raymond J Mathieu (2 out of 5 patents)
4. Gary Silvis (2 out of 7 patents)
5. Thomas Howland (2 out of 2 patents)
6. Daniel L Haynes (2 out of 2 patents)
7. Jeffrey J Ballman (2 out of 2 patents)
8. Michael L Ernst (1 out of 7 patents)
9. James S Amtmann (1 out of 1 patent)
10. Kenneth D Allen (1 out of 2 patents)
11. Chris Nakoff (1 out of 1 patent)
12. Jeffrey A Batten (1 out of 1 patent)
13. Mark R Casto (1 out of 1 patent)
14. Jeff Masterman (1 out of 1 patent)
15. John D Wiedemann (1 out of 1 patent)
11 patents:
Company Overview
Mac Tools, Inc. is a prominent manufacturer and distributor of professional automotive tools and equipment, catering primarily to the automotive repair and maintenance sectors. The company specializes in high-quality hand tools, power tools, and tool storage solutions, designed to meet the rigorous demands of automotive professionals. Headquartered in Washington Court House, Ohio, Mac Tools is recognized for its commitment to innovation and quality, providing essential products that enhance efficiency and performance in automotive service environments.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Mac Tools, Inc.. Retrieved from https://idiyas.com/company/mac-tools
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]