Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
5 Patents
#1 in Sweetwater, TX
#3,333 in Texas
#51,644 in US
Ludlum Measurements, Inc.
Forward Citations = 8
12 inventors:
Sweetwater, TX, United States of America
Ludlum Measurements, Inc.
EPO Patents = 1
Trademarks = 5
Forward Citations = 8
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12 inventors (with patents filed for the assignee):
John William Birks (4 out of 14 patents)
Peter Christian Andersen (4 out of 6 patents)
Craig Joseph Williford (4 out of 7 patents)
4. Andrew Allen Turnipseed (3 out of 3 patents)
5. Natalia P Zaitseva (1 out of 15 patents)
6. M Leslie Carman (1 out of 20 patents)
7. Andrew Neil Mabe (1 out of 5 patents)
8. Stephen Anthony Payne (1 out of 64 patents)
9. Nicholas Richard Myllenbeck (1 out of 9 patents)
10. Kyle Ray Shipp (1 out of 1 patent)
11. Terence C O'Brien (1 out of 1 patent)
12. Charles R Hurlbut (1 out of 1 patent)
13. Kevin Marriott (1 patent)
14. Paul Hepworth (0 patent)
15. Jeremy Williams (0 patent)
5 patents:
Company Overview
Ludlum Measurements, Inc. is a leading manufacturer of radiation detection equipment and instruments. With a history dating back to 1962, Ludlum has established itself as a trusted provider of high-quality, reliable products for nuclear power, health physics, and homeland security applications. Their diverse product line includes radiation detectors, monitors, and survey meters, all designed to meet the needs of customers in a variety of industries.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ludlum Measurements, Inc.. Retrieved from https://idiyas.com/company/ludlum-measurements
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]