Singapore, Singapore

Leica Instruments Pte. Ltd.

Calculating rank
USPTO Granted Patents = 19

% Expired Patents = 5.3


Forward Citations = 237

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32 inventors (with patents filed for the assignee):

goldMedal Werner Holbl (6 out of 15 patents)

silverMedal Stefan Thiem (4 out of 21 patents)

bronzeMedal Manfred Biehl (3 out of 8 patents)

4.  Rolf Metzner (2 out of 16 patents)

5.  Uwe Kiene (2 out of 7 patents)

6.  Dag Graupner (1 out of 4 patents)

7.  Maria Lehrl (1 out of 1 patent)

8.  Wolfgang Pesendorfer (1 out of 1 patent)

9.  Eric Barth (1 out of 4 patents)

10.  Bernd Guenther (1 out of 1 patent)

11.  Ulrich Neymeyr (1 out of 1 patent)

12.  Gernot Hansel (1 out of 4 patents)

13.  Manfred Kempe (1 out of 1 patent)

14.  Georg Herrmann (1 out of 1 patent)

15.  Werner Hoelbl (1 out of 24 patents)


19 patents:

Company Overview
Leica Instruments Pte. Ltd. is a prominent player in the field of precision measurement and imaging solutions. Based in Singapore, the company specializes in developing advanced optical and digital technologies for various applications, including microscopy and industrial measurement. With a strong focus on innovation, Leica Instruments aims to enhance research and quality control processes across multiple industries, ensuring accuracy and reliability in their products. The company's commitment to excellence positions it as a leader in the global market for high-performance instruments.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Nov 10 2026

19 Patents

#129 in Singapore

#129 in Singapore

#32,767 in the World

Singapore, SG
Singapore, Singapore
Forward Citations = 237

32 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Leica Instruments Pte. Ltd.. Retrieved from https://idiyas.com/company/leica-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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