Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
33 Patents
#10 in Elkhart, IN
#153 in Indiana
#10,309 in US
#20,162 in the World
Leer Group
Forward Citations = 34
31 inventors:
Elkhart, IN, United States of America
Leer Group
CIPO Patents = 1
EPO Patents = 1
Forward Citations = 34
Loading Chart...
Loading Chart...
31 inventors (with patents filed for the assignee):
Eugene Andrew Dylewski, Ii (19 out of 41 patents)
Christopher David Mattison (10 out of 21 patents)
Ernest M McDonald, Ii (8 out of 25 patents)
4. Jeffrey Joal Hickey (5 out of 8 patents)
5. Donald Richard Ireland (5 out of 10 patents)
6. Terrill D Becker (5 out of 8 patents)
7. John William Bevis, Iii (5 out of 11 patents)
8. Eugene A Dylewski (5 out of 11 patents)
9. Mitchell Austin Westra (4 out of 6 patents)
10. James D Fletcher (4 out of 18 patents)
11. Adrian Cook (3 out of 6 patents)
12. Justin J McGraw (3 out of 6 patents)
13. Tommy C Brock (3 out of 3 patents)
14. Marcus K Junod (2 out of 3 patents)
15. Thomas Augustine Hubbard (2 out of 4 patents)
Core Competencies:
Tonneau Cover
Bulkhead Panel
Bedslide Assembly
Truck Cap
Folding Cover
Vehicle Door Latch
Rolling Cover
Automatic Door Systems
Pinch Latch
Clamp Shim
Tie-Down Assembly
Low Voltage Controller
33 patents:
Company Overview
Leer Group, based in Elkhart, Indiana, specializes in the design and manufacturing of high-quality truck caps and tonneau covers. The company is recognized for its commitment to innovation and quality, serving a diverse customer base in the automotive aftermarket. Leer Group focuses on enhancing vehicle functionality and aesthetics through advanced engineering and durable materials. Its products are widely used across North America, reflecting a strong presence in the automotive accessories market.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Leer Group. Retrieved from https://idiyas.com/company/leer-group
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]