Southfield, MI, United States of America

Lear Donnelly Overhead Systems, L.l.c.


USPTO Granted Patents = 18

Forward Citations = 288

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29 inventors (with patents filed for the assignee):

goldMedal Douglas A Fischer (8 out of 14 patents)

silverMedal Mark R Litke (5 out of 12 patents)

bronzeMedal Dean T Miller (4 out of 11 patents)

4.  Douglas C Miller (4 out of 14 patents)

5.  Bradley D Miller (3 out of 6 patents)

6.  George B Byma (2 out of 9 patents)

7.  John Rickfelder (2 out of 3 patents)

8.  Graham L Weeks (1 out of 4 patents)

9.  Richard J Weber (1 out of 14 patents)

10.  Stephen J Forbes (1 out of 7 patents)

11.  Brian Begg (1 out of 2 patents)

12.  Jack M Van Ert (1 out of 11 patents)

13.  Brian J Rogalske (1 out of 1 patent)

14.  Robert W Donaldson (1 out of 1 patent)

15.  Michael S Serbay (1 out of 1 patent)


18 patents:

Company Overview
Lear Donnelly Overhead Systems, L.L.C. is a specialized entity based in Southfield, Michigan, focusing on the design and manufacturing of advanced overhead systems for the automotive industry. The company is known for its innovative solutions that enhance vehicle functionality and passenger experience. With a commitment to engineering excellence, Lear Donnelly integrates cutting-edge technology into its products, contributing to the evolution of automotive design and safety standards. The firm plays a significant role in shaping the future of mobility through its expertise in overhead systems.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

18 Patents

#25 in Southfield, MI

#645 in Michigan

#17,963 in US

#34,217 in the World

Southfield, MI (US)
Southfield, MI, United States of America
Forward Citations = 288

29 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Lear Donnelly Overhead Systems, L.l.c.. Retrieved from https://idiyas.com/company/lear-donnelly-overhead-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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