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USPTO Data Jan 1 1976 - Nov 3 2026
13 Patents
#48 in Dayton, OH
#1,005 in Ohio
#23,860 in US
#45,085 in the World
Lambert Corporation
Forward Citations = 185
15 inventors:
Dayton, OH, United States of America
Lambert Corporation
Calculating rank
Forward Citations = 185
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15 inventors (with patents filed for the assignee):
Robert R Yeager (6 out of 6 patents)
Walter F Ruhl (5 out of 5 patents)
James M Weaver (3 out of 4 patents)
4. Ronald E Shaner (2 out of 2 patents)
5. Dean A Bliskey (2 out of 2 patents)
6. Stephen K Lambert (2 out of 2 patents)
7. Jeffrey A Steed (2 out of 2 patents)
8. Hugh F Groth (1 out of 10 patents)
9. Guilbert M Hunt (1 out of 9 patents)
10. Albert W Nelson (1 out of 1 patent)
11. Gerald N Marshall (1 out of 1 patent)
12. Jesse J Lucy (1 out of 1 patent)
13. Richard H Florer (1 out of 1 patent)
14. Thomas E Via (1 out of 1 patent)
15. Thomas Kearnes (1 out of 3 patents)
13 patents:
Company Overview
Lambert Corporation, based in Dayton, OH, specializes in advanced manufacturing solutions and innovative engineering services. The company focuses on developing high-quality products and technologies that cater to various industries, including aerospace, automotive, and defense. With a commitment to research and development, Lambert Corporation aims to enhance operational efficiency and drive technological advancements. Their expertise spans multiple domains, ensuring they remain at the forefront of industry trends and customer needs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Lambert Corporation. Retrieved from https://idiyas.com/company/lambert
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]