Trademarks = 1

Forward Citations = 63

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8 inventors (with patents filed for the assignee):

Franz Steinbacher (2 out of 5 patents)

Josef Steininger (2 out of 3 patents)

Helmut Brandl (1 out of 11 patents)

4. Erwin Fosodeder (1 out of 6 patents)

5. Arthur Gritzky (1 out of 10 patents)

6. Franz Wiesauer (1 out of 4 patents)

7. Manfred Aichhorn (1 out of 1 patent)

8. Artur Gritzky (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 7011632 - Methods and apparatus for ultrasonic compound imaging (2006-03-14),

2. 6676603 - Method and apparatus for beam compounding (2004-01-13),

3. 6450962 - Ultrasonic diagnostic methods and apparatus for generating images from multiple 2D slices (2002-09-17),

4. 6106471 - Procedure for an examination of objects by the means of ultrasound waves (2000-08-22),

Company Overview

Kretztechnik Ag is a leading provider of cutting-edge technology solutions for various industries. With a strong focus on innovation and quality, we offer a diverse range of products and services including automation solutions, industrial sensors, and control systems. Our experienced team of professionals is dedicated to delivering reliable and efficient solutions to meet the unique needs of our clients. Visit our website to learn more about how Kretztechnik Ag can help drive your business forward.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#1 in Zipf

#606 in Austria

Zipf, Austria

Kretztechnik Ag

Forward Citations = 63

8 inventors:

Franz Steinbacher (2 out of 5 patents)

Josef Steininger (2 out of 3 patents)

Helmut Brandl (1 out of 11 patents)

4. Erwin Fosodeder (1 out of 6 patents)

5. Arthur Gritzky (1 out of 10 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Kretztechnik Ag. Retrieved from https://idiyas.com/company/kretztechnik-ag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]