Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
4 Patents
#617 in Wilmington, DE
#860 in Delaware
#60,704 in US
Knc Ner Acquisition Sub, Inc.
Forward Citations = 38
11 inventors:
Wilmington, DE, United States of America
Knc Ner Acquisition Sub, Inc.
Calculating rank
% Expired Patents = 100.0
CIPO Patents = 2
Forward Citations = 38
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11 inventors (with patents filed for the assignee):
Bruce P Lee (4 out of 16 patents)
John L Murphy (2 out of 7 patents)
Laura Vollenweider (2 out of 5 patents)
4. Fangmin Xu (2 out of 5 patents)
5. Jeffrey L Dalsin (2 out of 8 patents)
6. Arinne N Lyman (1 out of 4 patents)
7. William D Lew (1 out of 6 patents)
8. Sunil Silvary (1 out of 3 patents)
9. Amanda Spitz (1 out of 2 patents)
10. Jeanne Virosco (1 out of 1 patent)
11. Jed White (1 out of 1 patent)
4 patents:
Company Overview
KNC Ner Acquisition Sub, Inc. is a leading technology company specializing in mergers and acquisitions. With a team of experienced professionals, we provide expert advice and support to companies looking to expand through strategic acquisitions. Our goal is to facilitate successful transactions that benefit all parties involved. Visit our website to learn more about our services and how we can help your company grow.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Knc Ner Acquisition Sub, Inc.. Retrieved from https://idiyas.com/company/knc-ner-acquisition-sub
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]