% Expired Patents = 20.0

Forward Citations = 27

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5 inventors (with patents filed for the assignee):

Philip Casimir Kazmierowicz (5 out of 6 patents)

Steven Arthur Schultz (3 out of 3 patents)

Miles Moreau (1 out of 2 patents)

4. Stanley Douglas Schultz (1 out of 1 patent)

5. Eric Dransfeldt (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 6606537 - Method for correcting process temperature profile in a multi-zone thermal processor (2003-08-12),

2. 6560514 - Method and apparatus for optimizing control of a part temperature in conveyorized thermal processor (2003-05-06),

3. 6470239 - Method for maximizing throughput of a part in a conveyorized thermal processor (2002-10-22),

4. 6453219 - Method and apparatus for controlling temperature response of a part in a conveyorized thermal processor (2002-09-17),

5. 6283379 - Method for correlating processor and part temperatures using an air temperature sensor for a conveyorized thermal processor (2001-09-04),

Company Overview

Kic Thermal Profiling is a leading provider of thermal profiling solutions for the electronics manufacturing industry. With a focus on quality and innovation, Kic offers a range of products and services designed to optimize the process control and efficiency of thermal processes. Their advanced thermal profiling systems help customers achieve consistent results and improve overall production output.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

5 Patents

#875 in San Diego, CA

#12,058 in California

#51,570 in US

San Diego, CA, United States of America

Kic Thermal Profiling

Forward Citations = 27

5 inventors:

Philip Casimir Kazmierowicz (5 out of 6 patents)

Steven Arthur Schultz (3 out of 3 patents)

Miles Moreau (1 out of 2 patents)

4. Stanley Douglas Schultz (1 out of 1 patent)

5. Eric Dransfeldt (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Kic Thermal Profiling. Retrieved from https://idiyas.com/company/kic-thermal-profiling

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]