Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
16 Patents
#2 in Cedarburg, WI
#463 in Wisconsin
#19,922 in US
#37,831 in the World
The Kelch Corporation
Forward Citations = 175
14 inventors:
Cedarburg, WI, United States of America
The Kelch Corporation
Forward Citations = 175
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14 inventors (with patents filed for the assignee):
James E Blomquist (4 out of 4 patents)
Gary R Guzikowski (3 out of 6 patents)
Robert M Larson (3 out of 4 patents)
4. Ronald E Koebernik (3 out of 3 patents)
5. Robert Daniel Tharp (2 out of 5 patents)
6. Michael Joseph Holz (2 out of 10 patents)
7. Daniel J Manning (2 out of 3 patents)
8. Jeffrey Allen Davis (1 out of 1 patent)
9. Austin Raymond Savio Braganza (1 out of 1 patent)
10. Barry S Simon (1 out of 1 patent)
11. Peter A Finn (1 out of 1 patent)
12. Kay E Prepodnik (1 out of 1 patent)
13. Michael E Stiever (1 out of 1 patent)
14. Ben J Porath (1 out of 1 patent)
16 patents:
Company Overview
The Kelch Corporation, based in Cedarburg, Wisconsin, specializes in the development and manufacturing of precision measurement and dispensing systems. Their innovative solutions cater primarily to the automotive and industrial sectors, focusing on enhancing efficiency and accuracy in fluid management processes. With a commitment to advancing technology, Kelch integrates cutting-edge research in automation and control systems, positioning itself as a leader in providing high-quality products that meet the evolving needs of its clients.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: The Kelch Corporation. Retrieved from https://idiyas.com/company/kelch
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]