Forward Citations = 103

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7 inventors (with patents filed for the assignee):

John M DiMartino (2 out of 3 patents)

Steven A Ignatowicz (1 out of 9 patents)

Ivars E Pakulis (1 out of 1 patent)

4. David M Wyatt (1 out of 1 patent)

5. John G Crump, Sr (1 out of 1 patent)

6. Stephen R Reebs (1 out of 1 patent)

7. Raul Brenner (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 4794256 - Fast neutron process measurement system (1988-12-27),

2. 4785664 - Ultrasonic sensor (1988-11-22),

3. 4753106 - Steam quality meter (1988-06-28),

4. 4251810 - Apparatus for and methods of remotely monitoring outputs of (1981-02-17),

5. 4170073 - Wide dynamic range multi-zone drying method and apparatus for (1979-10-09),

6. 4131845 - Microwave moisture sensor chute (1978-12-26),

Company Overview

Kay-ray, Inc. is a leading provider of advanced technology solutions for businesses. With a focus on innovation and customer satisfaction, we offer a wide range of products and services to help companies streamline their operations and improve efficiency. Our team of experts is dedicated to delivering high-quality solutions tailored to meet the unique needs of each client. Contact us today to learn more about how Kay-ray, Inc. can help your business succeed.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

6 Patents

#24 in Arlington Heights, IL

#2,109 in Illinois

#44,949 in US

Arlington Heights, IL, United States of America

Kay-Ray, Inc.

Forward Citations = 103

7 inventors:

John M DiMartino (2 out of 3 patents)

Steven A Ignatowicz (1 out of 9 patents)

Ivars E Pakulis (1 out of 1 patent)

4. David M Wyatt (1 out of 1 patent)

5. John G Crump, Sr (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Kay-Ray, Inc.. Retrieved from https://idiyas.com/company/kay-ray

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]