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USPTO Data Jan 1 1976 - Oct 20 2026
12 Patents
#1 in Biberach/Riss
#3,300 in Germany
#48,209 in the World
Kaltenbach & Voight Gmbh
Forward Citations = 74
15 inventors:
Kaltenbach & Voight Gmbh
Calculating rank
% Expired Patents = 8.3
Forward Citations = 74
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15 inventors (with patents filed for the assignee):
Thomas Classen (6 out of 10 patents)
Markus Haarmann (6 out of 8 patents)
Marcel Ott (6 out of 6 patents)
4. Thomas Birk (6 out of 6 patents)
5. Juergen Butscher (5 out of 5 patents)
6. Bernhard Kuhn (3 out of 34 patents)
7. Thomas Braun (1 out of 5 patents)
8. Josef Duesing (1 out of 6 patents)
9. Erich Bareth (1 out of 8 patents)
10. Hans Loge (1 out of 14 patents)
11. Bernd Gugel (1 out of 35 patents)
12. Bernhard Lingenhole (1 out of 9 patents)
13. Jurgen Butscher (1 out of 1 patent)
14. Alexander Klee (1 out of 1 patent)
15. Thomas Claβen (1 out of 1 patent)
12 patents:
Company Overview
Kaltenbach & Voight GmbH is a specialized engineering firm based in Biberach/Riss, Germany, focusing on the development and manufacturing of high-precision machinery and components. The company excels in providing innovative solutions for various industries, including automotive and mechanical engineering. With a commitment to quality and technological advancement, Kaltenbach & Voight integrates advanced research methodologies to enhance product performance and reliability, catering to a diverse clientele across Europe and beyond.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Kaltenbach & Voight Gmbh. Retrieved from https://idiyas.com/company/kaltenbach-and-voight
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]