Newark, CA, United States of America

Kaiam Corp.


USPTO Granted Patents = 19

% Expired Patents = 78.9


Forward Citations = 38

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14 inventors (with patents filed for the assignee):

goldMedal Bardia Pezeshki (19 out of 23 patents)

silverMedal John F Heanue (12 out of 78 patents)

bronzeMedal Dinh Ton (4 out of 5 patents)

4.  Henk Bulthuis (3 out of 4 patents)

5.  Michael Sherback (3 out of 3 patents)

6.  Thomas Pierre Schrans (2 out of 24 patents)

7.  Lucas Soldano (2 out of 5 patents)

8.  Gideon Yoffe (2 out of 4 patents)

9.  Charles Amsden (1 out of 5 patents)

10.  Jamie Stokes (1 out of 4 patents)

11.  Ramsey Selim (1 out of 3 patents)

12.  Owen Shea (1 out of 1 patent)

13.  Andrew Grant (1 out of 1 patent)

14.  Alice Liu (1 out of 1 patent)


19 patents:

Company Overview
Kaiam Corp. is a technology company based in Newark, California, specializing in advanced optical interconnect solutions. The organization focuses on developing high-performance photonic devices and systems that enhance data transmission capabilities for data centers and telecommunications. By leveraging innovative manufacturing techniques and cutting-edge research, Kaiam aims to address the growing demands for bandwidth and connectivity in an increasingly digital world, positioning itself as a key player in the optical networking industry.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 13 2026

Kaiam Corp. USPTO Patent Assignee Logo
19 Patents

#21 in Newark, CA

#4,099 in California

#17,138 in US

#32,663 in the World

Newark, CA (US)
Newark, CA, United States of America
Forward Citations = 38

14 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Kaiam Corp.. Retrieved from https://idiyas.com/company/kaiam

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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