Bloomfield, CT, United States of America

The J. M. Ney Company

Calculating rank
USPTO Granted Patents = 21

Forward Citations = 290

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18 inventors (with patents filed for the assignee):

goldMedal Frank M Kulig (6 out of 7 patents)

silverMedal Edward F Smith (4 out of 32 patents)

bronzeMedal Stephen P Schaffer (4 out of 4 patents)

4.  Arthur S Klein (3 out of 10 patents)

5.  Thomas B Cameron (2 out of 2 patents)

6.  Harry P Yorgensen, Jr (2 out of 2 patents)

7.  Robert A Semrow (1 out of 1 patent)

8.  Fred E Thorburn (1 out of 2 patents)

9.  Matthew M Guzowski (1 out of 2 patents)

10.  Frank H Nealon (1 out of 1 patent)

11.  Arthur P Burnett (1 out of 1 patent)

12.  Bruce Burk (1 out of 1 patent)

13.  Randall M German (1 out of 1 patent)

14.  Irving G Winer (1 out of 1 patent)

15.  David C Wright (1 out of 1 patent)


21 patents:

Company Overview
The J. M. Ney Company, based in Bloomfield, CT, specializes in the development and manufacturing of advanced materials and components for various industries. With a focus on precision engineering, the company provides innovative solutions in areas such as aerospace, automotive, and medical applications. Their expertise encompasses a range of technologies, including metal injection molding and custom alloy production, positioning them as a key player in the materials science sector. J. M. Ney is committed to delivering high-quality products that meet the evolving needs of its global clientele.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

21 Patents

#6 in Bloomfield, CT

#383 in Connecticut

#15,719 in US

#30,018 in the World

Bloomfield, CT (US)
Bloomfield, CT, United States of America
Forward Citations = 290

18 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: The J. M. Ney Company. Retrieved from https://idiyas.com/company/j-m-ney-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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