Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
8 Patents
#245 in Seattle, WA
#827 in Washington
#35,954 in US
Integrated Diagnostics, Inc.
Forward Citations = 174
12 inventors:
Seattle, WA, United States of America
Integrated Diagnostics, Inc.
Calculating rank
EPO Patents = 1
Trademarks = 4
Forward Citations = 174
Loading Chart...
Loading Chart...
12 inventors (with patents filed for the assignee):
Paul Edward Kearney (7 out of 23 patents)
Xiao-Jun Li (7 out of 14 patents)
Clive Hayward (6 out of 13 patents)
4. Kenneth Charles Fang (4 out of 11 patents)
5. Leroy E Hood (1 out of 73 patents)
6. Miguel Dominguez Geeraerts (1 out of 2 patents)
7. Marcello Marelli (1 out of 7 patents)
8. Stephen W Hunsucker (1 out of 1 patent)
9. Lik Wee Lee (1 out of 1 patent)
10. Patricia M Beckmann (1 out of 2 patents)
11. Xiaojun Li (1 out of 1 patent)
12. Richard Johnson (1 out of 1 patent)
13. Paul Edward Kearney (0 patent)
8 patents:
Company Overview
Integrated Diagnostics, Inc. is a leading provider of molecular diagnostics solutions that help physicians and patients make informed decisions about healthcare. With a focus on early detection and personalized medicine, the company offers a range of cutting-edge tests and technologies for detecting and monitoring diseases such as cancer, infectious diseases, and genetic disorders. Their innovative approach to diagnostics aims to improve patient outcomes and reduce healthcare costs.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Integrated Diagnostics, Inc.. Retrieved from https://idiyas.com/company/integrated-diagnostics
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]