Forward Citations = 101

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5 inventors (with patents filed for the assignee):

Ira L Morgan (5 out of 8 patents)

Robert H Rice (5 out of 5 patents)

Joseph E Bolger (5 out of 11 patents)

4. Donald G Schindler (3 out of 3 patents)

5. Robert M Crane (2 out of 2 patents)

5 patents: Sort by Forward Citations

1. 5614720 - Mobile, multi-mode apparatus and method for nondestructively inspecting (1997-03-25),

2. 5608660 - Automated system for controlling the quality of geometrically (1997-03-04),

3. 5420427 - Mobile, multi-mode apparatus and method for nondestructively inspecting (1995-05-30),

4. 5414648 - Nondestructively determining the dimensional changes of an object as a (1995-05-09),

5. 5379237 - Automated system for controlling the quality of regularly-shaped (1995-01-03),

Company Overview

Integrated Diagnostic Measurement Corporation (IDM Corp) is a leading provider of innovative measurement solutions for various industries. Our cutting-edge technology and expertise in diagnostics enable us to deliver accurate and reliable results to our clients. With a focus on quality and customer satisfaction, IDM Corp is committed to helping businesses improve their performance and efficiency through advanced measurement solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

5 Patents

#493 in Austin, TX

#3,331 in Texas

#51,620 in US

Austin, TX, United States of America

Integrated Diagnostic Measurement Corporation

Forward Citations = 101

5 inventors:

Ira L Morgan (5 out of 8 patents)

Robert H Rice (5 out of 5 patents)

Joseph E Bolger (5 out of 11 patents)

4. Donald G Schindler (3 out of 3 patents)

5. Robert M Crane (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Integrated Diagnostic Measurement Corporation. Retrieved from https://idiyas.com/company/integrated-diagnostic-measurement

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]