Trademarks = 8

Forward Citations = 1

Loading Chart...

9 inventors (with patents filed for the assignee):

Douglas E Loy (3 out of 3 patents)

Edward John Bawolek (3 out of 36 patents)

Suzan Jane Bawolek (1 out of 1 patent)

4. Frederick Frye (1 out of 2 patents)

5. David A Hardinger (1 out of 2 patents)

6. Robert A Kimball (1 out of 1 patent)

7. Dong Hyuk Jang (1 out of 1 patent)

8. Sang Hoon Chae (1 out of 1 patent)

9. Spencer R Canizales (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 11900712 - Method and apparatus for capture of a fingerprint using an electro-optical material (2024-02-13),

2. 11710759 - Single contact relief print generator (2023-07-25),

3. 10949642 - Method for capture of a fingerprint using an electro-optical material (2021-03-16),

4. 10915771 - Method and apparatus for securing a captured fingerprint (2021-02-09),

Company Overview

Integrated Biometrics, LLC is a leading developer and manufacturer of fingerprint biometric solutions. Their patented light-emitting sensor technology enables fast, accurate, and reliable fingerprint capture. Their products are used in a wide range of applications including law enforcement, border control, and mobile identity verification.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

4 Patents

#26 in Spartanburg, SC

#356 in South Carolina

#60,641 in US

Spartanburg, SC, United States of America

Integrated Biometrics, LLC

Forward Citations = 1

9 inventors:

Douglas E Loy (3 out of 3 patents)

Edward John Bawolek (3 out of 36 patents)

Suzan Jane Bawolek (1 out of 1 patent)

4. Frederick Frye (1 out of 2 patents)

5. David A Hardinger (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Integrated Biometrics, LLC. Retrieved from https://idiyas.com/company/integrated-biometrics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]