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USPTO Data Jan 1 1976 - Oct 27 2026
15 Patents
#2 in Closter, NJ
#802 in New Jersey
#21,085 in US
#39,991 in the World
Intech Corporation
Forward Citations = 129
15 inventors:
Closter, NJ, United States of America
Intech Corporation
Calculating rank
% Expired Patents = 13.3
Forward Citations = 129
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15 inventors (with patents filed for the assignee):
John W Glaze, Jr (5 out of 5 patents)
Georg Bartosch (2 out of 10 patents)
Todor S Mihov (2 out of 2 patents)
4. Wallace W Bowley (2 out of 6 patents)
5. Curtis R Ritch (2 out of 2 patents)
6. Hans Gaede (2 out of 2 patents)
7. James H Sewell (2 out of 2 patents)
8. Saied Hussaini (1 out of 313 patents)
9. Chris Ballard (1 out of 1 patent)
10. Ernest E Cline (1 out of 3 patents)
11. John W Baker (1 out of 10 patents)
12. Niann-Gwo L Ou (1 out of 1 patent)
13. Billy Mac Graves (1 out of 1 patent)
14. Philip S LaChapelle (1 out of 1 patent)
15. Marc R Iacovelli (1 out of 316 patents)
15 patents:
Company Overview
Intech Corporation, based in Closter, NJ, specializes in advanced technology solutions, focusing on the development and manufacturing of high-performance electronic components and systems. The company is known for its expertise in areas such as telecommunications, aerospace, and defense, providing innovative products that meet rigorous industry standards. With a commitment to research and development, Intech aims to drive technological advancements and enhance operational efficiencies across various sectors.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Intech Corporation. Retrieved from https://idiyas.com/company/intech
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]