Instro Precision Limited

Calculating rank

USPTO Granted Patents = 7

% Expired Patents = 85.7

EPO Patents = 1

Forward Citations = 296

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3 inventors (with patents filed for the assignee):

Christopher John Morcom (5 out of 11 patents)

John Morcom (1 out of 1 patent)

Leslie F Brown (1 out of 1 patent)

7 patents: Sort by Forward Citations

1. 8354928 - Intruder detection system (2013-01-15),

2. 8098712 - Optical correlation apparatus and method (2012-01-17),

3. 7834985 - Surface profile measurement (2010-11-16),

4. 7319777 - Image analysis apparatus (2008-01-15),

5. 7248344 - Surface profile measurement (2007-07-24),

6. 6753950 - Optical distance measurement (2004-06-22),

7. 4636103 - Locking mechanism (1987-01-13),

Company Overview

Instro Precision Limited is a leading provider of high-quality electro-optical systems and solutions for defense, security, and industrial applications. With over 60 years of experience, Instro offers a wide range of products including surveillance systems, target acquisition solutions, and weapon sights for military and law enforcement agencies worldwide.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

7 Patents

#3 in Broadstairs

#2,345 in United Kingdom

Broadstairs, United Kingdom

Instro Precision Limited

Forward Citations = 296

3 inventors:

Christopher John Morcom (5 out of 11 patents)

John Morcom (1 out of 1 patent)

Leslie F Brown (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Instro Precision Limited. Retrieved from https://idiyas.com/company/instro-precision

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]