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USPTO Data Jan 1 1976 - Oct 13 2026
12 Patents
#15 in Chelmsford, MA
#1,546 in Massachusetts
#25,557 in US
#48,163 in the World
Inspectron Corporation
Forward Citations = 100
23 inventors:
Chelmsford, MA, United States of America
Inspectron Corporation
% Expired Patents = 16.7
EPO Patents = 2
Trademarks = 7
Forward Citations = 100
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23 inventors (with patents filed for the assignee):
Tye L Newman (6 out of 18 patents)
Brent F Lyons (5 out of 5 patents)
Shepherd H Whitcomb (3 out of 8 patents)
4. Al Boehnlein (3 out of 12 patents)
5. Owen W Draper (2 out of 8 patents)
6. Jeffrey C Schober (2 out of 2 patents)
7. Kenneth G Berquist (2 out of 2 patents)
8. Xintong Zhang (2 out of 2 patents)
9. Richard Louis Price (1 out of 24 patents)
10. Aaron Scarth (1 out of 1 patent)
11. Jeff Plane (1 out of 1 patent)
12. Josh T Guerra (1 out of 1 patent)
13. German Linares (1 out of 1 patent)
14. Nigel Parkin (1 out of 1 patent)
15. Mohanan Unni (1 out of 1 patent)
12 patents:
Company Overview
Inspectron Corporation, based in Chelmsford, MA, specializes in advanced inspection and measurement technologies. The company focuses on developing innovative solutions for various industries, including manufacturing and quality control, utilizing cutting-edge imaging and sensing technologies. Inspectron's expertise lies in enhancing product quality and operational efficiency through precise measurement systems and automated inspection processes, contributing to the advancement of manufacturing standards and practices.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Inspectron Corporation. Retrieved from https://idiyas.com/company/inspectron
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]