Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
4 Patents
#4 in Apple Valley, MN
#1,652 in Minnesota
#60,704 in US
Infinity Laser Measuring LLC
Forward Citations = 16
9 inventors:
Apple Valley, MN, United States of America
Infinity Laser Measuring LLC
Calculating rank
% Expired Patents = 50.0
CIPO Patents = 2
EPO Patents = 1
Trademarks = 2
Forward Citations = 16
Loading Chart...
Loading Chart...
9 inventors (with patents filed for the assignee):
Eric Jason Krause (2 out of 16 patents)
Daniel Darst (2 out of 45 patents)
Robin Knoke (2 out of 7 patents)
4. Mark W Schulz (2 out of 15 patents)
5. William M Roth (2 out of 5 patents)
6. Matt J Brunk (2 out of 2 patents)
7. Lee Gordon Macklem (2 out of 4 patents)
8. Hartland William Deering, Jr (2 out of 2 patents)
9. Darryl W Koop (1 out of 2 patents)
10. Lee G Macklem (1 patent)
11. Mark S Freeman (0 patent)
12. Mark S Freeman (0 patent)
4 patents:
Company Overview
Infinity Laser Measuring LLC provides advanced laser measuring solutions to clients in various industries. With precision engineering and cutting-edge technology, we offer accurate measurements for construction, interior design, and architecture projects. Our innovative products help streamline workflows and improve efficiency for our customers.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Infinity Laser Measuring LLC. Retrieved from https://idiyas.com/company/infinity-laser-measuring
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]