Forward Citations = 295

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7 inventors (with patents filed for the assignee):

Forrest S Wright (3 out of 14 patents)

Ralph M Grant (3 out of 9 patents)

Richard E Haskell (3 out of 6 patents)

4. Yau Y Hung (1 out of 6 patents)

5. Stanley R Windeler (1 out of 2 patents)

6. Ted R Zimmerman (1 out of 1 patent)

7. Anthony Paskus (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 4702594 - Double exposure interferometric analysis of structures and employing (1987-10-27),

2. 4690552 - Optical method and apparatus for strain analysis (1987-09-01),

3. 4620223 - Interferometric deformation analysis system (1986-10-28),

4. 4425039 - Apparatus for the practice of double exposure interferometric (1984-01-10),

5. 4392745 - Tilt head camera for interferometric analysis of tires (1983-07-12),

6. 4171794 - Fixturing for inspection of the interior of tire casings (1979-10-23),

Company Overview

Industrial Holographics, Inc. specializes in developing cutting-edge holographic technologies for industrial applications. Our holographic solutions revolutionize processes in manufacturing, quality control, and training. With our expertise in holography and advanced imaging techniques, we provide innovative solutions to improve efficiency and accuracy in various industries.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

6 Patents

#1 in Auburn Heights, MI

#1,526 in Michigan

#44,981 in US

Auburn Heights, MI, United States of America

Industrial Holographics, Inc.

Forward Citations = 295

7 inventors:

Forrest S Wright (3 out of 14 patents)

Ralph M Grant (3 out of 9 patents)

Richard E Haskell (3 out of 6 patents)

4. Yau Y Hung (1 out of 6 patents)

5. Stanley R Windeler (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Industrial Holographics, Inc.. Retrieved from https://idiyas.com/company/industrial-holographics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]