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USPTO Data Jan 1 1976 - Oct 13 2026
4 Patents
#221 in Vancouver
#3,464 in Canada
Ifd Internal Fault Detector Corp.
Forward Citations = 16
10 inventors:
Ifd Internal Fault Detector Corp.
CIPO Patents = 1
EPO Patents = 1
Trademarks = 1
Forward Citations = 16
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10 inventors (with patents filed for the assignee):
Justin George Pezzin (3 out of 4 patents)
John Paul Chisholm (3 out of 4 patents)
Jeremy Michael Van Horn (2 out of 2 patents)
4. Yen-You Lin (2 out of 2 patents)
5. Sophie Anne Ramsden (2 out of 2 patents)
6. Adam John Hunsberger (1 out of 1 patent)
7. Hyuk Jae Lee (1 out of 1 patent)
8. Robert W Suggitt (1 out of 10 patents)
9. Stuart H Hicks (1 out of 2 patents)
10. Nikola Cuk (1 out of 3 patents)
4 patents:
Company Overview
IFD Internal Fault Detector Corp. is a leading provider of innovative internal fault detection solutions for various industries. Our cutting-edge technology helps businesses detect and prevent internal faults in their systems, ensuring smooth operations and continuous uptime. With years of experience and a commitment to excellence, IFD Internal Fault Detector Corp. is the trusted choice for companies looking to safeguard their critical infrastructure.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ifd Internal Fault Detector Corp.. Retrieved from https://idiyas.com/company/ifd-internal-fault-detector
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]