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For the Inventor, By the Inventor

Austin, TX, United States of America

Ic Analytica, LLC


USPTO Granted Patents = 2

Forward Citations = 1

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3 inventors (with patents filed for the assignee):

goldMedal Richard Wunderlich (2 out of 4 patents)

silverMedal Joseph S Spector (2 out of 3 patents)

bronzeMedal Patrick G Drennan (2 out of 3 patents)


2 patents:

1. 12153087 - Apparatus and method for testing all test circuits on a wafer from a single test site (2024-11-26),
2. 12007429 - Apparatus and method for managing power of test circuits (2024-06-11),
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USPTO Data Jan 1 1976 - Sep 15 2026

2 Patents

#889 in Austin, TX

#6,291 in Texas

#94,628 in US

Austin, TX (US)
Austin, TX, United States of America

Ic Analytica, LLC

Forward Citations = 1

3 inventors:

goldMedal Richard Wunderlich (2 out of 4 patents)

silverMedal Joseph S Spector (2 out of 3 patents)

bronzeMedal Patrick G Drennan (2 out of 3 patents)

Please report any incorrect information to [email protected]
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