Trademarks = 1

Forward Citations = 26

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5 inventors (with patents filed for the assignee):

Ari Lichtenberg (5 out of 5 patents)

Heath A Jensen (1 out of 5 patents)

Aron Lichtenberg (1 out of 1 patent)

4. John F Shaw (1 out of 1 patent)

5. Duy P Le (1 out of 2 patents)

6 patents: Sort by Forward Citations

1. 11247803 - Label applicator bellow sprayer (2022-02-15),

2. 11130603 - Method and apparatus for removing unattached labels from a label applicator system (2021-09-28),

3. 11104155 - Method and apparatus for protecting a print head in a thermal printer (2021-08-31),

4. 10786999 - Method and apparatus for protecting a print head in a thermal printer (2020-09-29),

5. 10399358 - Method and apparatus for protecting a print head in a thermal printer (2019-09-03),

6. 8066044 - Method and apparatus for high speed produce labeling (2011-11-29),

Company Overview

Hurst International, LLC is a leading provider of innovative solutions for the global import and export industry. Our diverse range of services includes freight forwarding, customs brokerage, warehousing, and distribution. With a strong focus on customer satisfaction and operational efficiency, we strive to exceed expectations and deliver value to our clients worldwide.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#60 in Chatsworth, CA

#10,578 in California

#45,007 in US

Chatsworth, CA, United States of America

Hurst International, LLC

Forward Citations = 26

5 inventors:

Ari Lichtenberg (5 out of 5 patents)

Heath A Jensen (1 out of 5 patents)

Aron Lichtenberg (1 out of 1 patent)

4. John F Shaw (1 out of 1 patent)

5. Duy P Le (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hurst International, LLC. Retrieved from https://idiyas.com/company/hurst-international

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]