% Expired Patents = 12.5

EPO Patents = 1

Trademarks = 1

Forward Citations = 43

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4 inventors (with patents filed for the assignee):

Klaus Krebs (5 out of 6 patents)

Carsten Ney (4 out of 7 patents)

Hartwig Kahlcke (2 out of 19 patents)

4. Josef Albrecht (1 out of 1 patent)

8 patents: Sort by Forward Citations

1. 11359903 - Roller tape measure with extensible stretching and measuring device (2022-06-14),

2. D938840 - Tape measure hook (2021-12-21),

3. D935920 - Tape measure (2021-11-16),

4. D935919 - Tape measure (2021-11-16),

5. 7900369 - Electronic measuring tape and a length measuring device provided therewith (2011-03-08),

6. 5367784 - Roll tape measure (1994-11-29),

7. D351059 - Seam ripper (1994-10-04),

8. 5297340 - Parting tool (1994-03-29),

Company Overview

Hoechstmass Balzer GmbH is a leading manufacturer of high-quality measuring instruments and tailor-made solutions for the textile industry. With over 70 years of experience, we provide innovative products and services to meet the specific needs of our customers. Our commitment to quality and precision has made us a trusted partner for textile professionals worldwide.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

8 Patents

#11 in Sulzbach

#4,418 in Germany

Sulzbach, Germany

Hoechstmass Balzer Gmbh

Forward Citations = 43

4 inventors:

Klaus Krebs (5 out of 6 patents)

Carsten Ney (4 out of 7 patents)

Hartwig Kahlcke (2 out of 19 patents)

4. Josef Albrecht (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hoechstmass Balzer Gmbh. Retrieved from https://idiyas.com/company/hoechstmass-balzer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]