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USPTO Data Jan 1 1976 - Oct 13 2026
9 Patents
#2,020 in Tokyo
#4,699 in Japan
Hirakawa Hewtech Corporation
Forward Citations = 120
16 inventors:
Hirakawa Hewtech Corporation
% Expired Patents = 44.4
EPO Patents = 2
Trademarks = 2
Forward Citations = 120
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16 inventors (with patents filed for the assignee):
Mitsuo Iwasaki (3 out of 3 patents)
Yasuo Furukawa (2 out of 47 patents)
Shigeru Matsumura (2 out of 31 patents)
4. Mitsunori Satou (2 out of 2 patents)
5. Shigeru Murayama (2 out of 9 patents)
6. Hiroshi Wakabayashi (2 out of 2 patents)
7. Hisao Saito (1 out of 1 patent)
8. Mitsuo Nanjo (1 out of 1 patent)
9. Katsuo Tanaka (1 out of 1 patent)
10. Hiroyuki Kimura (1 out of 1 patent)
11. Tetsuo Yamaguchi (1 out of 1 patent)
12. Takao Ishido (1 out of 1 patent)
13. Takaaki Kusama (1 out of 1 patent)
14. Mitsuo Nanjyo (1 out of 1 patent)
15. Hiroyuki Tanaka (1 out of 1 patent)
9 patents:
Company Overview
Hirakawa Hewtech Corporation is a leading semiconductor manufacturing company specializing in the production of cutting-edge electronics components. With a focus on quality and innovation, we provide solutions for a wide range of industries, including automotive, telecommunications, and consumer electronics.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hirakawa Hewtech Corporation. Retrieved from https://idiyas.com/company/hirakawa-hewtech
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
2 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]