Heys International Ltd.

Calculating rank

USPTO Granted Patents = 10

CIPO Patents = 2

EPO Patents = 1

Trademarks = 14

Forward Citations = 94

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2 inventors (with patents filed for the assignee):

Emran Y Sheikh (10 out of 11 patents)

Alden Evangelista (8 out of 8 patents)

Ben Niu (3 out of 3 patents)

4. Jia Yi Liang (2 out of 3 patents)

10 patents: Sort by Forward Citations

1. 10772402 - Hard-sided luggage bag with front lid (2020-09-15),

2. D862880 - Luggage (2019-10-15),

3. 9894970 - Hard-sided luggage bag with front lid (2018-02-20),

4. 9733118 - Compact handheld scale for luggage (2017-08-15),

5. D769619 - Luggage (2016-10-25),

6. 9380845 - Luggage with wrap around design panel (2016-07-05),

7. D743283 - Flat scale (2015-11-17),

8. D743168 - Luggage (2015-11-17),

9. D742769 - Cylinder scale (2015-11-10),

10. D718939 - Luggage (2014-12-09),

Company Overview

Heys International Ltd. is a Canadian company based in Mississauga, specializing in the design and manufacture of innovative luggage and travel accessories. The company is known for its commitment to quality and functionality, offering a diverse range of products that cater to the needs of modern travelers. Heys integrates advanced materials and technology into its designs, ensuring durability and style. With a focus on enhancing the travel experience, Heys continues to evolve its product offerings to meet the demands of a dynamic market.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 10 2026

10 Patents

#83 in Mississauga

#1,527 in Canada

#56,228 in the World

Mississauga, Canada

Heys International Ltd.

Forward Citations = 94

2 inventors:

Emran Y Sheikh (10 out of 11 patents)

Alden Evangelista (8 out of 8 patents)

Ben Niu (3 out of 3 patents)

4. Jia Yi Liang (2 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Heys International Ltd.. Retrieved from https://idiyas.com/company/heys-international

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]