Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
10 Patents
#8 in Venlo
#619 in Netherlands
#56,092 in the World
Hauzer Holding B.v.
Forward Citations = 296
16 inventors:
Hauzer Holding B.v.
Forward Citations = 296
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16 inventors (with patents filed for the assignee):
Boudewijn J Buil (4 out of 4 patents)
Hans Veltrop (4 out of 4 patents)
Harald Wesemeyer (3 out of 3 patents)
4. Wolf-Dieter Munz (3 out of 3 patents)
5. Roel Tietema (2 out of 3 patents)
6. Dietmar Schulze (1 out of 3 patents)
7. Simon Boelens (1 out of 1 patent)
8. Horst Lob (1 out of 1 patent)
9. Fransiscus J Hauzer (1 out of 1 patent)
10. Sergey V Danysh (1 out of 1 patent)
11. Andrey V Obukhov (1 out of 1 patent)
12. Alexey N Lobanov (1 out of 1 patent)
13. Vladimir A Obukhov (1 out of 1 patent)
14. Franciscus J Hauzer (1 out of 1 patent)
15. Harald Wesemeyer, Deceased (1 out of 1 patent)
10 patents:
Company Overview
Hauzer Holding B.V., based in Venlo, Netherlands, specializes in advanced coating technologies, particularly in the field of physical vapor deposition (PVD). The company develops and manufactures innovative coating systems that enhance the performance and durability of various materials. Hauzer's expertise spans multiple industries, including automotive, aerospace, and tooling, where its solutions contribute to improved efficiency and product longevity. The organization is committed to research and development, continuously advancing its technology to meet evolving market demands.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hauzer Holding B.v.. Retrieved from https://idiyas.com/company/hauzer-holding-b-v
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]