Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
11 Patents
#84 in Hamburg
#3,523 in Germany
#51,761 in the World
H. Maihak A.g.
Forward Citations = 100
16 inventors:
H. Maihak A.g.
Trademarks = 2
Forward Citations = 100
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16 inventors (with patents filed for the assignee):
Heinz Delin (3 out of 3 patents)
Otto Blunck (3 out of 4 patents)
Horst Rusbuldt (2 out of 2 patents)
4. Reinhard Ulrich (1 out of 14 patents)
5. Klaus Jansen (1 out of 2 patents)
6. Rochus B Elmiger (1 out of 1 patent)
7. Harald Beck (1 out of 1 patent)
8. Willi Bonk (1 out of 1 patent)
9. Rudolf Muller (1 out of 1 patent)
10. Werner Voss (1 out of 1 patent)
11. Benny Aaris Klemar (1 out of 1 patent)
12. Johann Holst (1 out of 1 patent)
13. Karl-Heinz Zorner (1 out of 1 patent)
14. Hans F Bisgaard (1 out of 3 patents)
15. Wolfgang Olsowski (1 out of 1 patent)
11 patents:
Company Overview
H. Maihak A.G., based in Hamburg, Germany, specializes in the development and manufacturing of advanced measurement and control technology. The company focuses on providing innovative solutions for various industries, including maritime, chemical, and environmental sectors. With a commitment to precision and reliability, H. Maihak A.G. integrates cutting-edge technology into its products, ensuring high performance and compliance with industry standards. The organization is dedicated to enhancing operational efficiency through its expertise in measurement systems.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: H. Maihak A.g.. Retrieved from https://idiyas.com/company/h-maihak-a-g
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]