CIPO Patents = 1

EPO Patents = 2

Trademarks = 2

Forward Citations = 49

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3 inventors (with patents filed for the assignee):

Gary C Young (10 out of 10 patents)

Eric Stanley Wagner (1 out of 5 patents)

John C Wooley (1 out of 1 patent)

4. PE Gary C Young (0 patent)

10 patents: Sort by Forward Citations

1. 9212059 - [object Object] (2015-12-15),

2. 8937103 - [object Object] (2015-01-20),

3. 8916617 - [object Object] (2014-12-23),

4. 8507567 - [object Object] (2013-08-13),

5. 8178588 - [object Object] (2012-05-15),

6. 7932298 - [object Object] (2011-04-26),

7. 7923476 - [object Object] (2011-04-12),

8. 7310046 - Method for eliminating reading errors in a non-contact microwave solids flow meter (2007-12-18),

9. 6404344 - Method of compensating for erroneous reading in a mass flow meter (2002-06-11),

10. 5986553 - Flow meter that measures solid particulate flow (1999-11-16),

Company Overview

Gyco, Inc. is a technology-driven company based in Cedar Rapids, Iowa, specializing in the development and manufacturing of advanced solutions for various industries. The organization focuses on innovative products that enhance operational efficiency and safety, particularly in sectors such as aerospace, automotive, and industrial applications. Gyco's commitment to research and development enables it to stay at the forefront of technology, delivering high-quality solutions tailored to meet the evolving needs of its clients.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

10 Patents

#11 in Cedar Rapids, IA

#190 in Iowa

#29,882 in US

#56,092 in the World

Cedar Rapids, IA, United States of America

Gyco, Inc.

Forward Citations = 49

3 inventors:

Gary C Young (10 out of 10 patents)

Eric Stanley Wagner (1 out of 5 patents)

John C Wooley (1 out of 1 patent)

4. PE Gary C Young (0 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Gyco, Inc.. Retrieved from https://idiyas.com/company/gyco

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

2 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]