Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
10 Patents
#198 in Los Angeles, CA
#7,118 in California
#29,882 in US
#56,092 in the World
Global Trek Xploration Corp.
Forward Citations = 76
13 inventors:
Los Angeles, CA, United States of America
Global Trek Xploration Corp.
% Expired Patents = 80.0
CIPO Patents = 1
Forward Citations = 76
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13 inventors (with patents filed for the assignee):
Patrick E Bertagna (10 out of 29 patents)
Christopher M Walsh (5 out of 7 patents)
James H Cohen (4 out of 5 patents)
4. Ralph H Davis (4 out of 11 patents)
5. Gregg S Schilawski (4 out of 4 patents)
6. Alexander Gildea Stricker (4 out of 4 patents)
7. Dongeun Lim (4 out of 4 patents)
8. Gregory J Provenzano (4 out of 4 patents)
9. Michael J DiBella (3 out of 7 patents)
10. Joseph W Kaminski (2 out of 20 patents)
11. Jb Bittner Eriksen (2 out of 2 patents)
12. Ronald L Pellegrini (2 out of 2 patents)
13. Ruk Peterson (1 out of 2 patents)
10 patents:
Company Overview
Global Trek Xploration Corp., based in Los Angeles, CA, specializes in advanced exploration technologies and innovative solutions for various industries. The company focuses on developing cutting-edge tools and methodologies that enhance exploration and data collection in challenging environments. With a commitment to research and development, Global Trek Xploration aims to push the boundaries of exploration, leveraging expertise in fields such as geospatial analysis, remote sensing, and environmental monitoring to deliver impactful results.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Global Trek Xploration Corp.. Retrieved from https://idiyas.com/company/global-trek-xploration
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]