Forward Citations = 66

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7 inventors (with patents filed for the assignee):

Peter Anderson Geiser (3 out of 12 patents)

Jan Meredith Vermilye (2 out of 5 patents)

Charles John Sicking (2 out of 6 patents)

4. Thomas Fleure (1 out of 4 patents)

5. Duncan W Riley (1 out of 3 patents)

6. John F Gillooly, Jr (1 out of 1 patent)

7. Alfred Lacazette (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 9442205 - Method for assessing the effectiveness of modifying transmissive networks of natural reservoirs (2016-09-13),

2. 9389326 - Methods, systems and devices for near-well fracture monitoring using tomographic fracture imaging techniques (2016-07-12),

3. 9354336 - Microseismic data acquisition array and corresponding method (2016-05-31),

4. 9194967 - Tomographic imaging of fracture-fault permeability zones during drilling operations (2015-11-24),

Company Overview

Global Ambient Seismic, Inc. is a leading provider of ambient seismic monitoring solutions. We specialize in detecting and analyzing seismic activity to help our clients make informed decisions about their infrastructure and operations. Our team of experts uses cutting-edge technology to provide accurate and reliable monitoring services. Contact us today to learn more about how we can support your seismic monitoring needs.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#4 in Missouri City, TX

#3,939 in Texas

#60,671 in US

Missouri City, TX, United States of America

Global Ambient Seismic, Inc.

Forward Citations = 66

7 inventors:

Peter Anderson Geiser (3 out of 12 patents)

Jan Meredith Vermilye (2 out of 5 patents)

Charles John Sicking (2 out of 6 patents)

4. Thomas Fleure (1 out of 4 patents)

5. Duncan W Riley (1 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Global Ambient Seismic, Inc.. Retrieved from https://idiyas.com/company/global-ambient-seismic

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]