Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
7 Patents
#3 in Stewartville, MN
#1,122 in Minnesota
#39,950 in US
Geotek, Inc.
Forward Citations = 54
15 inventors:
Stewartville, MN, United States of America
Geotek, Inc.
Calculating rank
Trademarks = 3
Forward Citations = 54
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15 inventors (with patents filed for the assignee):
Bruce Frederick Blumentritt (4 out of 7 patents)
Conrad F Fingerson (4 out of 14 patents)
Brian Hornberg (3 out of 3 patents)
4. Tyler R Burbank (2 out of 2 patents)
5. Ricardo Felty (2 out of 2 patents)
6. Eugene Flowers (2 out of 2 patents)
7. David Sheldon (2 out of 2 patents)
8. Michael Steven Schoenoff (2 out of 6 patents)
9. Gerhard Ray Hylland (2 out of 2 patents)
10. Lawrence Lester Lange (2 out of 2 patents)
11. Christopher Alan Stenzel (1 out of 1 patent)
12. Richard Franklin Clyatt (1 out of 1 patent)
13. Harvey Eugene Flowers (1 out of 1 patent)
14. Steven Roger Volkman (1 out of 1 patent)
15. John C Fingerson (1 out of 1 patent)
7 patents:
Company Overview
Geotek, Inc. is a leading provider of geospatial and earth observation solutions. With a focus on cutting-edge technology and data analysis, Geotek serves a wide range of industries including agriculture, environmental monitoring, and urban planning. Their innovative products and services help clients make informed decisions and optimize their operations. Visit their website for more information.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Geotek, Inc.. Retrieved from https://idiyas.com/company/geotek
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]