Ostfildern, Germany

Gehring Technologies Gmbh

Calculating rank
USPTO Granted Patents = 12

% Expired Patents = 8.3


Trademarks = 1

Forward Citations = 17

Loading Chart...
Loading Chart...

23 inventors (with patents filed for the assignee):

goldMedal Gerhard Flores (7 out of 18 patents)

silverMedal Manuel Waiblinger (4 out of 6 patents)

bronzeMedal Andreas Wagner (4 out of 8 patents)

4.  Erwin Baumgartner (4 out of 4 patents)

5.  Andreas Wiens (3 out of 4 patents)

6.  Michael Rach (3 out of 3 patents)

7.  Oliver Bey (2 out of 2 patents)

8.  Niko Schamne (2 out of 2 patents)

9.  Klaus Litty (2 out of 2 patents)

10.  Martin Freitag (1 out of 1 patent)

11.  Wolfram Lohse (1 out of 1 patent)

12.  Rainer Köneke (1 out of 1 patent)

13.  Theodor Huettner (1 out of 1 patent)

14.  Michael Petschi (1 out of 1 patent)

15.  Frank Hummel (1 out of 1 patent)


12 patents:

Company Overview
Gehring Technologies GmbH, based in Ostfildern, Germany, specializes in precision engineering and advanced manufacturing solutions. The company is renowned for its expertise in honing technology, which is crucial for enhancing the performance and efficiency of various mechanical components. Gehring serves diverse industries, including automotive and machinery, focusing on innovative processes that improve product quality and operational efficiency. Their commitment to research and development positions them as a leader in precision manufacturing technologies.
Profile summary synthesized from public USPTO records and patent filings.

logo

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

12 Patents

#5 in Ostfildern

#3,301 in Germany

#48,235 in the World

Ostfildern, DE
Ostfildern, Germany
Forward Citations = 17

23 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Gehring Technologies Gmbh. Retrieved from https://idiyas.com/company/gehring-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…