Company Badge
USPTO Data Jan 1 1976 - Oct 20 2026
11 Patents
#3 in Apeldoorn
#569 in Netherlands
#51,801 in the World
Gastec N.v.
Forward Citations = 103
15 inventors:
Gastec N.v.
Calculating rank
% Expired Patents = 9.1
Forward Citations = 103
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15 inventors (with patents filed for the assignee):
John Wilhelm Geus (3 out of 49 patents)
Geuko Van Der Veen (3 out of 5 patents)
Johannes Borsboom (2 out of 7 patents)
4. Jan Adolf Lagas (2 out of 6 patents)
5. Alette Mulder (1 out of 1 patent)
6. Erik Alexander Polman (1 out of 1 patent)
7. Anthony Van Waveren (1 out of 1 patent)
8. Antonius Johannes Maria Van Wingerden (1 out of 1 patent)
9. Willem Johan Jacob Van Der Wal (1 out of 1 patent)
10. Aletta Mulder (1 out of 1 patent)
11. Francien Van Looy (1 out of 1 patent)
12. Robert Johan Terorde (1 out of 1 patent)
13. Johan Adrianus Hornemann (1 out of 1 patent)
14. Francine Van Looij (1 out of 1 patent)
15. Willem Hendrik Bouwman (1 out of 1 patent)
11 patents:
Company Overview
Gastec N.V. is a prominent company based in Apeldoorn, Netherlands, specializing in the development and manufacturing of gas detection and measurement solutions. The organization focuses on providing innovative technologies that ensure safety and compliance in various industries, including environmental monitoring, industrial safety, and healthcare. Gastec's expertise lies in creating reliable instruments and systems that facilitate accurate gas analysis, contributing to enhanced operational efficiency and safety standards across diverse applications.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Gastec N.v.. Retrieved from https://idiyas.com/company/gastec-n-v
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]