Company Badge
USPTO Data Jan 1 1976 - Nov 3 2026
7 Patents
#17 in Wayne, NJ
#1,484 in New Jersey
#39,974 in US
Gaf Building Materials Corporation
Forward Citations = 104
11 inventors:
Wayne, NJ, United States of America
Gaf Building Materials Corporation
Calculating rank
CIPO Patents = 1
Forward Citations = 104
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11 inventors (with patents filed for the assignee):
Louis L Grube (5 out of 17 patents)
Steven S Lalwani (3 out of 5 patents)
Adem Chich (2 out of 75 patents)
4. Alfredo A Bondoc (2 out of 39 patents)
5. Steven C Bettoli (2 out of 4 patents)
6. Stanley P Frankoski (2 out of 5 patents)
7. Charles J Horner, Jr (1 out of 13 patents)
8. William J Woodring (1 out of 7 patents)
9. Jason Gladfelter (1 out of 1 patent)
10. Philip J Halpin (1 out of 1 patent)
11. Donald Montgomery (1 out of 1 patent)
7 patents:
Company Overview
GAF Building Materials Corporation is the largest manufacturer of residential and commercial roofing materials in North America. The company offers a comprehensive line of roofing products, including shingles, ventilation systems, and waterproofing solutions. With a focus on innovation and sustainability, GAF is committed to providing high-quality, durable roofing solutions for customers across the globe.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Gaf Building Materials Corporation. Retrieved from https://idiyas.com/company/gaf-building-materials
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]