Company Badge
USPTO Data Jan 1 1976 - Oct 13 2026
16 Patents
#9 in Kenosha, WI
#463 in Wisconsin
#19,922 in US
#37,831 in the World
G. Leblanc Corporation
Forward Citations = 93
16 inventors:
Kenosha, WI, United States of America
G. Leblanc Corporation
% Expired Patents = 6.3
Trademarks = 3
Forward Citations = 93
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16 inventors (with patents filed for the assignee):
Lawrence V Ramirez (3 out of 3 patents)
James H Andersen (2 out of 14 patents)
Greg Hilliard (2 out of 2 patents)
4. Vito S Pascucci (2 out of 2 patents)
5. Tadashi Kume (1 out of 2 patents)
6. Hari Matsuda (1 out of 35 patents)
7. Richard Sylvan (1 out of 62 patents)
8. Gregory A Biba (1 out of 1 patent)
9. Gregory C Hilliard (1 out of 1 patent)
10. Michael W Suter (1 out of 1 patent)
11. Lawrence V Ramirez, Ii (1 out of 1 patent)
12. Philip C Wise (1 out of 1 patent)
13. Earl Joseph Gillespie (1 out of 1 patent)
14. Elmer J Aiello (1 out of 1 patent)
15. Walter Whiteside (1 out of 1 patent)
16 patents:
Company Overview
G. Leblanc Corporation, headquartered in Kenosha, WI, specializes in the development and manufacturing of high-quality industrial equipment and components. The company focuses on innovative solutions tailored for various sectors, including automotive and manufacturing. With a commitment to engineering excellence, G. Leblanc Corporation leverages advanced technologies to enhance operational efficiency and product reliability, positioning itself as a key player in the industrial landscape.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: G. Leblanc Corporation. Retrieved from https://idiyas.com/company/g-leblanc
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]